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A205 Multi Component Advanced Function IC Test Handler
The A205 is an advanced-function, high-performance handler that neatly balances market trends and needs. Key features and benefits include:
. 4500 UPH throughput (< 1.1 seconds measurement time, and excluding tray change time)
. Handles BGA, QFP, SOP, PLCC, SON with changeover kits
. Device chucking in the z-axis direction is via a motor on the pick-and-place robot
. Standard test head spacing is 600 mm from the test site
. Temperature range - room temperature, 50 - 125 C (standard)
. Up to 6 output classifications (3 standard)
. Allows trays to be unloaded and filled while the machine is operating
. Optional lead inspection unit
A206SP Multi Component Advanced Function IC Test Handler
This versatile test handler has been designed to offer the best performance and flexibility at the best price. Key features and benefits include:
. Maximum 3000 UPH throughput with an index time of 0.4 seconds per IC
. Handles BGA, QFP, SOP, PLCC, SON with changeover kits
. Changeover time is just 3 minutes
. Temperature range - room temperature, non-controlled. (50 - 125 C optional)
. 3 output classifications are standard (2 auto stacker)
. Allows trays to be unloaded and filled while the machine is operating
. Optional vision recognition alignment
. Optional 6 output classifications
A207 Multi Component Advanced Function IC Test Handler
The A207 is an advanced-function, high-performance handler that once again neatly balances market trends and needs. Key features and benefits include:
. High throughput with simultaneous measurement of up to 8 devices (selectable 1, 2, 4 or 8 units)
. Index time is minimum 0.6 seconds for 8 ICs
. Handles BGA, QFP, SOP, PLCC, SON with changeover kits
. Device chucking in the z-axis direction is via a motor on the pick-and-place robot
. Standard test head spacing is 600 mm from the test site
. Temperature range - room temperature, 50 - 125 C (standard)
. Up to 6 output classifications (3 standard)
. Allows trays to be unloaded and filled while the machine is operating
A variety of Fujitsu Tohoku Electronics product literature, performance specifications and other presentation material is available for download. To download documents in Adobe pdf format, please select any of the links below:
Multi Component Test Handler Product Brochures
. A205 Advanced Function IC Test Handler (518 KB)
. A206SP Advanced Function IC Test Handler (569 KB)
. A207 Advanced Function IC Test Handler (594 KB)
Multi Component Test Handler Product Specification Documents
. A205 Socket Specification (64 KB)
. A205 Specification (131 KB)
. A206SP Specification (75 KB)
. A207 Specification (164 KB)
. General Fujitsu Handler Specifications (20 KB)
Multi Component Test Handler Product Presentations
. A205 Presentation (1,288 KB)
. A206SP Presentation (374 KB)
. A207 Presentation (580 KB)
Please contact SESA for further assistance and product information or refer to our contact list of Sales Representatives within US and Canada.
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