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FOR IMMEDIATE RELEASE
CONTACT: Paul Gillespie at +1 (408) 416-2400
NEW PROBE CARD CLEANER FROM NIPPON SCIENTIFIC DRASTICALLY IMPROVES PROBE YIELDS
(January 1, 2002) The NSC PC-102 was designed in conjunction with a VLSI device manufacturer for thorough non-contact, non-abrasive cleaning of high density microspring probe cards. Thorough and proper cleaning of probe cards lowers contact resistance resulting in higher probe yields!
Non-contact, non-abrasive cleaning and drying methods also increase probe card life and reduce probe card maintenance costs. Cleaning, rinsing and drying recipes are programmable and recalled from memory. Cleaning solutions are stored in 2.0 liter bottles in the cabinet of the system. Waste is stored in a 20 liter bottle.
The PC-102 is only 29 inches wide and 22 inches deep, and requires a supply of DI water together with N2 or CDA.
Nippon Scientific Corporation ("NSC") manufactures equipment used in FA labs around the world. In addition to the PC-102, their systems consist of Single and Dual-Acid IC De-capsulation systems, three different Reactive Ion Etch systems, and IC Test systems to check for open/short, IDDq and power curve. NSC systems are known for their ease of use, and reliability.
For additional information, click here or contact SESA, Inc. at:
Tel +1 (408) 416-2400
Fax +1 (408) 416-2410
Internet http://www.sesa.com
email: pdg@sesa.com
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